Scanning probe microscopy

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Scanning probe microscopy measurements provide detailed characterization of materials properties on the atomic scale. In particular, scanning tunneling microscopy (STM) is capable of imaging the atomic lattice of a material, while scanning tunneling spectroscopy (STS) reveals its atomic-scale electronic structure. Research in our group focuses on the atomic-scale characterization and control of exotic electronic states of matter in a wide variety of vdW materials and heterostructures.